Atomic Force Microscopy (AFM)

AFM modes:

• Classical Contact and Tapping mode
• Peak Force QNM™
• Lateral Force Microscopy (LFM)
• Force Modulation Microscopy
• Magnetic Force Microscopy (MFM)
• Electric Force Microscopy (EFM)
• Surface Potential Microscopy (KPM)
• Phase Imaging
• Force Volume
• Electrochemical STM & AFM (ECM)
• Scanning Capacitance Microscopy (SCM)
• Scanning Spreading Resistance (SSRM)
• Tunneling AFM (TUNA)
• Conductive AFM (CAFM)
• Nanoindentation, Nanolithography, Nanomanipulation
• Torsional Resonance Mode (TR Mode)

AFM allows to perform measurements in liquids and in temperature range from 30°C to 250°C.